ÐÓ°ÉappÏÂÔØ

Biography

• 2003-present: Senior Lecturer in Engineering Systems, University of ÐÓ°ÉappÏÂÔØ
• 2000-2002: Research and Development Engineer, Zarlink Semiconductor Ltd
• 1995-2003: Part-time Lecturer, Electrical/Electronic Engineering, University of ÐÓ°ÉappÏÂÔØ.

Research/scholarly interests

• Optical process tomography
• Amorphous semiconductor sensor arrays
• Engineering education

Specialist interests

• Digital Signal Processing
• Systems Modelling
• Computer Simulation
• ASIC hardware design
• System-on-Chip
• Programming languages C++
• VHDL
• Matlab
• Simulink

Selected publications

Vaezi-Nejad, S.M., and Jenner, R.P. (2002) A high voltage computer controlled experimental system for the investigation of amorphous semiconductors as image sensors. Transactions of the Institute of Measurement and Control, 24(4), September 2002, pp. 303–32.

Vaezi-Nejad, S.M., and Jenner, R.P. 2002. Investigation of economical image sensors for optical process tomography: development of a computerised system. The 2002 International Conference on Imaging Science, Systems, and Technology (CISST'02). Monte Carlo Resort, Las Vegas, Nevada, USA, 24–27 June.

Vaezi-Nejad, S.M., and Jenner, R.P. (2000) Application of amorphous semiconductors for optical tomography. Measurement and Control, 33(6), pp. 175–80.

Vaezi-Nejad, S.M., and Jenner, R.P. (1999) Development of a novel light source for the investigation of optical sensors. Measurement and Control, 32, pp. 75–78.

Jenner, R.P. 1998. Development of instrumentation for a novel computer controlled experimental apparatus. Proceedings of 2nd International Conference on Planned Maintenance, Reliability and Quality. Oxford, 2–3 April 1998, p. 109.

Vaezi-Nejad, S.M., and Jenner, R.P. 1997. Principles and application of advanced transient photoconductivity techniques. Proceedings of the IEEE Instrumentation & Measurement Technology Conference 97. Ottawa, Canada, p. 942.

Selected publications

Vaezi-Nejad, S.M., and Jenner, R.P. (2002) A high voltage computer controlled experimental system for the investigation of amorphous semiconductors as image sensors. Transactions of the Institute of Measurement and Control, 24(4), September 2002, pp. 303–32.

Vaezi-Nejad, S.M., and Jenner, R.P. 2002. Investigation of economical image sensors for optical process tomography: development of a computerised system. The 2002 International Conference on Imaging Science, Systems, and Technology (CISST'02). Monte Carlo Resort, Las Vegas, Nevada, USA, 24–27 June.

Vaezi-Nejad, S.M., and Jenner, R.P. (2000) Application of amorphous semiconductors for optical tomography. Measurement and Control, 33(6), pp. 175–80.

Vaezi-Nejad, S.M., and Jenner, R.P. (1999) Development of a novel light source for the investigation of optical sensors. Measurement and Control, 32, pp. 75–78.

Jenner, R.P. 1998. Development of instrumentation for a novel computer controlled experimental apparatus. Proceedings of 2nd International Conference on Planned Maintenance, Reliability and Quality. Oxford, 2–3 April 1998, p. 109.

Vaezi-Nejad, S.M., and Jenner, R.P. 1997. Principles and application of advanced transient photoconductivity techniques. Proceedings of the IEEE Instrumentation & Measurement Technology Conference 97. Ottawa, Canada, p. 942.